Atomic force microscopy
The set-up of an atomic force microscope includes a very small tip that (almost) contacts the surface of a specimen. While scanning the sample, the tip moves up and down. This movement is followed and measured, resulting in an image of the surface with nanometer scale resolution. Atomic force microscopy does not only result in images, but is also widely used in force spectroscopy experiments. It can be used to study almost any type of surface.


